The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Sep. 10, 2019
Applicant:

Topcon Corporation, Tokyo-to, JP;

Inventors:

Fumio Ohtomo, Saitama, JP;

Kaoru Kumagai, Tokyo-to, JP;

Tetsuji Anai, Tokyo-to, JP;

Assignee:

TOPCON Corporation, Tokyo-to, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2006.01); G01C 11/06 (2006.01); G01C 1/02 (2006.01);
U.S. Cl.
CPC ...
G01C 15/006 (2013.01); G01C 11/06 (2013.01); G01C 1/02 (2013.01);
Abstract

A surveying instrument comprises a distance measuring unit configured to measure a distance to an object to be measured, an optical axis deflector configured to deflect a distance measuring light, a measuring direction image pickup module configured to acquires an observation image and an arithmetic control module, wherein the arithmetic control module is configured to continuously cut out sighting images around a tracking point set in the observation image, to set a first cutout sighting image as a reference sighting image, to calculate a movement amount of the sighting image with respect to the reference sighting image by an image matching of the reference sighting image and the sighting image and to control the optical axis deflector based on a calculation result in such a manner that the tracking point is positioned at a center of the sighting image.


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