The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2023
Filed:
Mar. 02, 2020
Applicant:
The Chinese University of Hong Kong, Hong Kong, CN;
Inventors:
Yuk Ming Dennis Lo, Hong Kong, CN;
Wai Kwun Rossa Chiu, Hong Kong, CN;
Stephen Siu Chung Chim, Hong Kong, CN;
Yu-Kwan Tong, Hong Kong, CN;
Chunming Ding, Hangzhou, CN;
Assignee:
The Chinese University of Hong Kong, Hong Kong, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/6883 (2018.01); C12Q 1/6827 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6883 (2013.01); C12Q 1/6827 (2013.01); C12Q 2600/154 (2013.01); C12Q 2600/156 (2013.01);
Abstract
The present invention relates to new methods for diagnosing a pregnancy-associated disorder by analyzing fetal DNA present in the mother's blood. More specifically, this invention relies on the discovery that the maspin gene is differentially methylated in fetal DNA and in maternal DNA and provides these new diagnostic methods, which distinguish fetal DNA from maternal DNA and detect prenatal disorders based on abnormalities in fetal DNA level and methylation status.