The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Nov. 15, 2019
Applicant:

Depuy Synthes Products, Inc., Raynham, MA (US);

Inventors:

Shouchen Dun, Fort Wayne, IN (US);

Dustin R. Whitaker, Akron, IN (US);

Michael T. Saloka, Mt. Zion, IL (US);

Assignee:

DEPUY SYNTHES PRODUCTS, INC., Raynham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61F 2/46 (2006.01); A61B 17/92 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61F 2/4603 (2013.01); A61B 17/92 (2013.01); A61B 5/742 (2013.01); A61B 5/7405 (2013.01); A61B 5/7455 (2013.01); A61B 2560/0266 (2013.01); A61B 2560/0462 (2013.01);
Abstract

Technologies for determining seating of an orthopaedic implant during an orthopaedic surgical procedure includes an impaction sensor and an impaction analyzer. The impaction sensor produces sensor data, in response to an impaction between an orthopaedic mallet and a surgical tool indicative of an initial impact and a secondary impact of the impaction. The impaction analyzer analyzes the sensor data to determine a temporal length between the initial and secondary impacts and determines whether the orthopaedic implant is sufficiently seated into the bone based on the temporal length.


Find Patent Forward Citations

Dun, Shouchen. (2023). Technologies for determining seating of an orthopaedic implant during an orthopaedic surgical procedure (U.S. Patent No. 11596528). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11596528

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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