The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2023

Filed:

Nov. 28, 2018
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Myoung Hoon Jung, Bucheon-si, KR;

Kak Namkoong, Seoul, KR;

Yeol Ho Lee, Anyang-si, KR;

Won Jong Jung, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/053 (2021.01); A61B 5/024 (2006.01); A61B 5/08 (2006.01); A61B 5/0295 (2006.01); A61B 5/0205 (2006.01); A61B 5/0245 (2006.01); A61B 5/0265 (2006.01); A61B 5/0537 (2021.01); A61B 5/145 (2006.01); A61B 5/1477 (2006.01);
U.S. Cl.
CPC ...
A61B 5/053 (2013.01); A61B 5/7278 (2013.01); A61B 5/024 (2013.01); A61B 5/0205 (2013.01); A61B 5/0245 (2013.01); A61B 5/0265 (2013.01); A61B 5/0295 (2013.01); A61B 5/02405 (2013.01); A61B 5/0537 (2013.01); A61B 5/08 (2013.01); A61B 5/0809 (2013.01); A61B 5/1477 (2013.01); A61B 5/14546 (2013.01); A61B 5/4519 (2013.01); A61B 5/4866 (2013.01); A61B 5/4872 (2013.01); A61B 5/4875 (2013.01); A61B 2562/04 (2013.01);
Abstract

A bio-signal measuring apparatus includes a first electrode, a second electrode, a third electrode, a fourth electrode, and a first circuit network and a second circuit network, each of the first circuit network and the second circuit network includes one or more resistances. The bio-signal measuring apparatus further includes an impedance measurer configured to measure a first impedance of the first circuit network in a first correction mode, measure a second impedance of the second circuit network in a second correction mode, measure a third impedance of an object in a first measurement mode, using the first electrode, the second electrode, the third electrode, and the fourth electrode, and measure a fourth impedance of the object in a second measurement mode, using the first electrode, the second electrode, the third electrode, and the fourth electrode.


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