The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Apr. 22, 2021
Honeywell International Inc., Charlotte, NC (US);
Vibhor L Bageshwar, Rosemount, MN (US);
Michael Ray Elgersma, Plymouth, MN (US);
Ross Merritt, Ramsey, MN (US);
Honeywell International Inc., Charlotte, NC (US);
Abstract
A method of assuring integrity of range measurements and position solutions comprises obtaining range measurement statistics between network nodes, performing a snapshot integrity test for the range measurement statistics, and performing a sequential integrity test using the range measurement statistics. The snapshot integrity test comprises using Gram matrices with a current configuration of the nodes; performing a singular value consistency check using the Gram matrices against a user selected threshold; and detecting and excluding range measurement statistics with instantaneous errors that cause the singular value to exceed the threshold. The sequential integrity test comprises formulating main node and sub-node sets using solution separation; implementing filters for the main node and sub-node sets; performing a consistency check using discriminators and decision thresholds; detecting and excluding range measurement statistics with both instantaneous and time-correlated errors; and computing a protection level for relative positions computed from the main node and sub-node sets.