The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Aug. 11, 2020
Topcon Corporation, Tokyo, JP;
Takashi Tanaka, Tokyo, JP;
Takeshi Kikuchi, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
A crack measuring apparatus includes distance-measuring units, an image pickup unit having pixels the positions of which are identified on an imaging device, an infrared image pickup unit having pixels the positions of which are identified on an imaging device and having sensitivity to infrared rays, driving units, angle-measuring units, and an arithmetic control unit, the arithmetic control unit searches for a cracked portion from a temperature difference in an infrared image by turning the infrared image pickup unit, captures an image of the cracked portion by the image pickup unit and identifies a position of the cracked portion from a density difference in the captured image, measures the position of the cracked portion by the distance-measuring units and the angle-measuring units, and acquires three-dimensional absolute coordinates of the cracked portion.