The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Jul. 17, 2019
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Daisuke Nagano, Matsumoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/0264 (2006.01); H01L 31/0236 (2006.01); G04R 20/04 (2013.01); G04G 19/02 (2006.01); G04C 10/02 (2006.01); H01L 31/02 (2006.01); H01L 31/0224 (2006.01); H01L 31/054 (2014.01); H01L 31/05 (2014.01); H01L 31/0392 (2006.01); H01L 31/0216 (2014.01);
U.S. Cl.
CPC ...
H01L 31/02366 (2013.01); G04C 10/02 (2013.01); G04G 19/02 (2013.01); G04R 20/04 (2013.01); H01L 31/02008 (2013.01); H01L 31/0264 (2013.01); H01L 31/02168 (2013.01); H01L 31/022425 (2013.01); H01L 31/0392 (2013.01); H01L 31/05 (2013.01); H01L 31/0547 (2014.12);
Abstract

A photoelectric converter including a crystalline silicon substrate having a light receiving surface including a smooth section and a rough surface section having surface roughness greater than the surface roughness of the smooth section and a light transmissive inorganic film so provided as to overlap with the smooth section and the rough surface section, and the film thickness tof a portion of the inorganic film that is the portion where the inorganic film overlaps with the rough surface section is smaller than the film thickness tof a portion of the inorganic film that is the portion where the inorganic film overlaps with the smooth section. The arithmetic average roughness of the rough surface section is preferably greater than or equal to 0.1 μm.


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