The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Jun. 16, 2016
Northeastern University, Boston, MA (US);
The Schepens Eye Research Institute, Inc., Boston, MA (US);
NORTHEASTERN UNIVERSITY, Boston, MA (US);
THE SCHEPENS EYE RESEARCH INSTITUTE, INC., Boston, MA (US);
Abstract
Methods and systems providing adaptive assessment of a physical subject to efficiently collect assessment data and modify an assessment schedule based on the analyses. The methods and systems can control the timing of each assessment in order to collect data at times and under conditions that are most informative about the physical subject. Such adaptive methods and systems significantly minimize the frequency of data collection without loss in accuracy or precision and can increase test reliability through reduction in redundancy. The ability to estimate an unknown, underlying function using a small number of free parameters that remain constant regardless of the number of data points being estimated substantially reduces the error of the function estimate. Because estimates of the measurement error are achieved with a minimum of sampled assessments, and with great accuracy, the statistical power of clinical trials, for example, can be greatly increased.