The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Dec. 26, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Conrad M Albrecht, White Plains, NY (US);

Ildar Khabibrakhmanov, Syosset, NY (US);

Sharathchandra Pankanti, Darien, CT (US);

Levente Klein, Tuchahoe, NY (US);

Wang Zhou, White Plains, NY (US);

Bruce Gordon Elmegreen, Golden Bridge, NY (US);

Siyuan Lu, Yorktown Heights, NY (US);

Hendrik F Hamann, Yorktown Heights, NY (US);

Carlo Siebenschuh, Yorktown Heights, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/25 (2022.01); H04W 4/021 (2018.01); G06K 9/62 (2022.01); G06V 20/13 (2022.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G06V 10/25 (2022.01); G01S 17/89 (2013.01); G06K 9/6288 (2013.01); G06V 20/13 (2022.01); H04W 4/021 (2013.01);
Abstract

In some examples, a method of vector-raster data fusion includes receiving vector data for a geographical location, and statistically analyzing the vector data to obtain vector statistics. In some examples the method further includes rasterizing the vector statistics, and storing at least one of the vector data and the rasterized vector statistics together in a key-value store together with previously stored raster data for the geographical location. In some examples, the vector data further includes metadata, and the method further includes storing the metadata in at least one of the key-value store or a separate vector database.


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