The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Jun. 16, 2020
Applicant:

Nichia Corporation, Anan, JP;

Inventors:

Tadaaki Miyata, Yokohama, JP;

Hideki Kondo, Yokohama, JP;

Assignee:

NICHIA CORPORATION, Anan, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/174 (2017.01); A61B 1/06 (2006.01); G02B 27/48 (2006.01); G06T 7/246 (2017.01); A61B 1/05 (2006.01); A61B 1/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/174 (2017.01); A61B 1/000094 (2022.02); A61B 1/05 (2013.01); A61B 1/0661 (2013.01); G02B 27/48 (2013.01); G06T 7/246 (2017.01); A61B 1/00163 (2013.01); G06T 2207/30104 (2013.01);
Abstract

An image-capturing device includes: an illumination light source configured to emit illumination light to illuminate an object; a laser light source configured to emit laser light with a peak wavelength in a range of wavelengths absorbed or reflected by at least one region of the object; an imaging device configured to take an image of the object; a speckle variable device configured to change a speckle pattern in an image acquired by the imaging device over time; and an image processing device configured to process the image acquired by the imaging device, which includes: measuring a change over time in a intensity signal from each pixel constituting the image, and dividing an imaged region of the object into a plurality of portions based on a waveform of the change in the intensity signal over time.


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