The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Mar. 16, 2020
Applicant:

GE Precision Healthcare Llc, Milwaukee, WI (US);

Inventors:

Krishna Seetharam Shriram, Bangalore, IN;

Rahul Venkataramani, Bangalore, IN;

Aditi Garg, Bangalore, IN;

Chandan Kumar Mallappa Aladahalli, Bangalore, IN;

Assignee:

GE Precision Healthcare LLC, Milwaukee, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 8/00 (2006.01); G06T 7/11 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 8/42 (2013.01); A61B 8/461 (2013.01); G06T 7/11 (2017.01); G06T 7/73 (2017.01); G06T 2207/10132 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30004 (2013.01); G06T 2207/30168 (2013.01);
Abstract

Methods and systems are provided for assessing image quality of ultrasound images. In one example, a method includes determining a probe position quality parameter of an ultrasound image, the probe position quality parameter representative of a level of quality of the ultrasound image with respect to a position of an ultrasound probe used to acquire the ultrasound image, determining one or more acquisition settings quality parameters of the ultrasound image, each acquisition settings quality parameter representative of a respective level of quality of the ultrasound image with respect to a respective acquisition setting used to acquire the ultrasound image, and providing feedback to a user of the ultrasound system based on the probe position quality parameter and/or the one or more acquisition settings quality parameters, the probe position quality parameter and each acquisition settings quality parameter determined based on output from separate image quality assessment models.


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