The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Sep. 23, 2020
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Chunfeng Yao, Beijing, CN;

Bailan Feng, Beijing, CN;

Bo Yan, Shanghai, CN;

Ke Li, Shanghai, CN;

Bahetiyaer Bare, Shanghai, CN;

Li Qian, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); G06V 10/48 (2022.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 3/4053 (2013.01); G06T 3/4038 (2013.01); G06T 3/4084 (2013.01); G06V 10/454 (2022.01); G06V 10/48 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
Abstract

An image super-resolution method includes preprocessing the low-resolution image to obtain a vertical gradient map, a horizontal gradient map, and a luminance map, which are used as three different dimensions of information to constitute a to-be-input feature map, performing size conversion on the to-be-input feature map to obtain an input feature map, performing nonlinear transformation on the input feature map to obtain an input feature map obtained after the nonlinear transformation, and performing weighted processing on the input feature map and the input feature map obtained after the nonlinear transformation, to obtain an output feature map, performing size conversion on the output feature map to obtain a residual map, and combining the low-resolution image and the residual map to obtain a high-resolution image.


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