The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Jun. 30, 2017
Koninklijke Philips N.v., Eindhoven, NL;
Rolf Jurgen Weese, Norderstedt, DE;
Alexandra Groth, Hamburg, DE;
Tilman Wekel, Krummesse, DE;
Vincent Maurice Andre Auvray, Meudon, FR;
Raoul Florent, Ville d'Avray, FR;
Romane Isabelle Marie-Bernard Gauriau, Paris, FR;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
An information retrieval system (IPS). The system comprises an input interface (IN) for receiving a query related to an object of interest. A concept mapper (CM) is configured to map the query to one or more associated concept entries of a hierarchic graph data structure (ONTO). The entries in said structure encode linguistic descriptors of components of a model (GM) for said object (OB). A metric-mapper (MM) is configured to map the query to one or more metric relationship descriptors. A geo-mapper (GEO) is configured to map said concept entries against the geometric model linked to the hierarchic graph data structure to obtain spatio-numerical data associated with said linguistic descriptors. A metric component (MTC) is configured to compute one or more metric or spatial relationships between said object components based on the spatio-numerical data and the one or more metric relationship descriptors.