The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

May. 16, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Masato Utsumi, Tokyo, JP;

Tohru Watanabe, Tokyo, JP;

Ikuo Shigemori, Tokyo, JP;

Youko Sakikubo, Tokyo, JP;

Toshiyuki Sawa, Tokyo, JP;

Hiroshi Iimura, Tokyo, JP;

Hiroaki Ogawa, Tokyo, JP;

Yoshihisa Okamoto, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06F 17/15 (2006.01); G06K 9/62 (2022.01); G06Q 10/04 (2012.01);
U.S. Cl.
CPC ...
G06N 7/00 (2013.01); G06F 17/15 (2013.01); G06K 9/6218 (2013.01); G06K 9/6267 (2013.01); G06Q 10/04 (2013.01);
Abstract

Provided is a data prediction system for predicting a future prediction value. The data prediction system has a data management device which manages data and a prediction operation device which models tendency of an error amount of a prediction operation result calculated on the basis of a correlation with a major explanatory variable and corrects a future prediction value. The data management device includes a storage unit which stores prediction target past measurement data observed with a time transition and explanatory factor data explaining the prediction target past measurement data. The prediction operation device includes a first prediction operation unit which performs prediction on the basis of a correlation between the prediction target past measurement data and the explanatory factor data, a second prediction operation unit which models tendency of an error of an operation result of the first prediction operation unit and performs future error amount prediction of the operation result of the first prediction operation unit, and a correction unit which corrects the operation result of the first prediction operation unit by an operation result of the second prediction operation unit.


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