The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Nov. 29, 2019
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Pranav Garg, Jersey City, NJ (US);

Srinivasan Sengamedu Hanumantha Rao, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06N 20/00 (2019.01); G06N 5/04 (2006.01); G06F 8/75 (2018.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06F 8/75 (2013.01); G06F 21/577 (2013.01); G06N 20/00 (2019.01);
Abstract

Techniques for performing machine learning-based program analysis using synthetically generated labeled data are described. A method of performing machine learning-based program analysis using synthetically generated labeled data may include receiving a request to perform program analysis on code, determining a first portion of the code associated with a first error type, sending the first portion of the code to an endpoint of a machine learning service associated with an error detection model to detect the first error type, the error detection model trained using synthetically generated labeled data, and receiving inference results from the error detection model identifying one or more errors of the first error type in the first portion of the code.


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