The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Nov. 30, 2018
Baidu Usa, Llc, Sunnyvale, CA (US);
Joel Hestness, Mountain View, CA (US);
Gregory Diamos, San Jose, CA (US);
Hee Woo Jun, Sunnyvale, CA (US);
Sharan Narang, Sunnyvale, CA (US);
Newsha Ardalani, Santa Clara, CA (US);
Md Mostofa Ali Patwary, Gilroy, CA (US);
Yanqi Zhou, San Jose, CA (US);
Baidu USA LLC, Sunnyvale, CA (US);
Abstract
As deep learning application domains grow, a deeper understanding of the relationships between training set size, computational scale, and model accuracy improvements is extremely beneficial. Presented herein are large-scale empirical study of error and model size growth as training sets grow. Embodiments of a methodology for this measurement are introduced herein as well as embodiments for predicting other metrics, such as compute-related metrics. It is shown herein that power-law may be used to represent deep model relationships, such as error and training data size. It is also shown that model size scales sublinearly with data size. These scaling relationships have significant implications on deep learning research, practice, and systems. They can assist model debugging, setting accuracy targets, and decisions about data set growth. They can also guide computing system design and underscore the importance of continued computational scaling.