The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Jul. 21, 2020
GE Precision Healthcare Llc, Milwaukee, WI (US);
Min Zhang, San Ramon, CA (US);
Gopal B. Avinash, San Ramon, CA (US);
Zili Ma, San Ramon, CA (US);
Kevin H. Leung, San Ramon, CA (US);
Wen Jin, Fremont, CA (US);
GE Precision Healthcare LLC, Milwaukee, WI (US);
Abstract
Techniques are provided for determining confident data samples for machine learning (ML) models on unseen data. In one embodiment, a method is provided that comprises extracting, by a system comprising a processor, a feature vector for a data sample based on projection of the data sample onto a standard feature space. The method further comprises processing, by the system, the feature vector using an outlier detection model to determine whether the data sample is within a scope of a training dataset used to train a machine learning model, wherein the outlier detection model was trained using features extracted from the training dataset based on projection of data samples included in the training dataset onto the standard feature space.