The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Apr. 26, 2021
Imperva, Inc., San Mateo, CA (US);
Itsik Mantin, Shoham, IL;
Craig Burlingame, Mounds View, MN (US);
Brian Anderson, San Diego, CA (US);
Kunal Anand, Los Angeles, CA (US);
Ran Rosin, Ramat Hasharon, IL;
Peter Klimek, Seattle, WA (US);
Joseph Moore, San Diego, CA (US);
Imperva, Inc., San Mateo, CA (US);
Abstract
A method by one or more computing devices for detecting application user anomalies in audit logs of database operations performed on one or more databases. The method includes obtaining a first audit log of database operations, wherein the first audit log indicates (1) which application users of an application caused which of the database operations to be performed and (2) which functions of the application caused which of the database operations to be performed, generating, for each of the application users indicated in the first audit log, a profile of that application user that indicates which of the functions that application user is expected to touch, and detecting an anomaly in response to a determination that a second audit log indicates that an application user touched a function that is not one of the functions indicated in the profile of the application user.