The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Sep. 25, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Petar Ristoski, San Jose, CA (US);

Anna Lisa Gentile, San Jose, CA (US);

Daniel Gruhl, San Jose, CA (US);

Alfredo Alba, Morgan Hill, CA (US);

Chris Kau, Mountain View, CA (US);

Chad DeLuca, Morgan Hill, CA (US);

Linda Kato, San Jose, CA (US);

Ismini Lourentzou, Urbana, IL (US);

Steven R. Welch, Gilroy, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/36 (2019.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01); G06F 40/30 (2020.01); G06F 40/295 (2020.01);
U.S. Cl.
CPC ...
G06F 16/367 (2019.01); G06F 40/295 (2020.01); G06F 40/30 (2020.01); G06N 3/0427 (2013.01); G06N 3/0454 (2013.01); G06N 3/08 (2013.01);
Abstract

One embodiment provides a method that includes determining candidate ontologies for alignment from multiple available knowledge bases. An initial target ontology is selected from the candidate ontologies and correcting the initial selected ontology with received refinement input. Concepts in the selected initial ontology are aligned with concepts of the target ontology using a deep learning hierarchical classification with received review input. A user is assisted to build, change and grow the selected initial ontology exploiting both the target ontology and new facts extracted from unstructured data.


Find Patent Forward Citations

Loading…