The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Mar. 16, 2020
International Business Machines Corporation, Armonk, NY (US);
Andrew C. M. Hicks, Wappingers Falls, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Kevin Minerley, Red Hook, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for testing a system under test (SUT) in an active environment includes executing, by the testing system, on the SUT, a test from a set of tests. The method further includes, monitoring a first execution time to complete the test on the SUT in the active environment. Based on the first execution time being different than a second execution time of the test, marking, by the testing system, a code path associated with the test. The second execution time is a duration to complete execution of the test on the SUT in a clean execution environment. The method further includes communicating, by the testing system, the code path for analyzing a soft failure of the SUT in the active environment, wherein the soft failure occurs in the active environment during execution of the SUT based at least on a parameter of the active environment.