The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Dec. 18, 2019
Applicant:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Inventors:

Ziehen Huang, Richmond Hill, CA;

Harsoveet Singh, Mississauga, CA;

Jonathan Kelly, Toronto, CA;

Mahyar Vajedi, Mississauga, CA;

Assignee:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05D 1/02 (2020.01);
U.S. Cl.
CPC ...
G05D 1/0221 (2013.01); G05D 1/0274 (2013.01); G05D 2201/0216 (2013.01);
Abstract

A method for dynamic loop closure in a mobile automation apparatus includes: obtaining mapping trajectory data defining a plurality of trajectory segments traversing a facility to be mapped; controlling a locomotive mechanism of the apparatus to traverse a current segment; generating a sequence of keyframes for the current segment using sensor data captured via a navigational sensor of the apparatus; and, for each keyframe: determining an estimated apparatus pose based on the sensor data and a preceding estimated pose corresponding to a preceding keyframe; and, determining a noise metric defining a level of uncertainty associated with the estimated pose relative to the preceding estimated pose; determining, for a selected keyframe, an accumulated noise metric based on the noise metrics for the selected keyframe and each previous keyframe; and when the accumulated noise metric exceeds a threshold, updating the mapping trajectory data to insert a repetition of one of the segments.


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