The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Nov. 29, 2019
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Sebastian Roeglinger, Pfaffenhofen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06F 16/907 (2019.01); G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0216 (2013.01); G05B 19/0425 (2013.01); G05B 23/0294 (2013.01); G06F 16/907 (2019.01);
Abstract

A system is provided for measurement data management in a distributed environment. The system comprises at least one storage system adapted to obtain raw measurement data or intermediate results from at least one measurement site via a network. In addition, the system further comprises a database, operatively connected to the said storage system, adapted to be accessed remotely by the measurement site via the network. The storage system or the measurement site is further adapted to perform successive processing steps on the raw measurement data along a process chain in order to generate measurement results, whereby associating metadata with the raw measurement data and with the measurement results. In this context, the metadata associated with each measurement result of the successive processing steps is provided with a new reference as well as a reference to the reference of the measurement result from the preceding processing step.


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