The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
May. 14, 2019
Fanuc Corporation, Yamanashi, JP;
Hirosato Yoshida, Yamanashi, JP;
Nobuyuki Ootake, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
An abnormality detector includes a signal output unit for detecting a sign of an abnormality based on a physical quantity acquired from a manufacturing machine and outputting a signal; and a machine learning device including state observation unit for observing, as a state variable representing a present state of the environment, physical quantity data indicating the physical quantity related to an operation of the manufacturing machine from the manufacturing machine; a label data acquisition unit for acquiring, as label data, operation state data indicating an operation state of the manufacturing machine; a learning unit for learning the operation state of the manufacturing machine with respect to the physical quantity, using the state variable and the label data; and an estimation result output unit for estimating the operation state of the manufacturing machine using a learning result by the learning unit and outputting an estimation result.