The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Jan. 29, 2020
Applicant:

Ford Global Technologies, Llc, Dearborn, MI (US);

Inventors:

Rajarshi Roychowdhury, Dearborn, MI (US);

David Jeffeory Berels, Plymouth, MI (US);

Mahmoud Yousef Ghannam, Canton, MI (US);

Scott Mayberry, Allen Park, MI (US);

Assignee:

Ford Global Technologies, LLC, Dearborn, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B64C 39/02 (2006.01); G01R 27/26 (2006.01); G01R 31/28 (2006.01); B64D 47/08 (2006.01);
U.S. Cl.
CPC ...
G01R 27/26 (2013.01); B64C 39/024 (2013.01); G01R 31/2832 (2013.01); B64C 2201/027 (2013.01); B64C 2201/12 (2013.01); B64C 2201/127 (2013.01); B64C 2201/146 (2013.01); B64D 47/08 (2013.01);
Abstract

A system for testing a plurality of electrical circuits includes a first remote cooperative testing device including a testing component and a first transceiver and a second remote cooperative testing device including a conductive component and a second transceiver. In response to receiving instructions from a remote computing device, the first remote cooperative testing device locates a first electrical circuit and a second electrical circuit and selectively positions the testing component to electrically couple a first portion of the first electrical circuit to a first portion of the second electrical circuit at a first node, and the second remote cooperative testing device selectively positions the conductive component to electrically couple a second portion of the first electrical circuit to a second portion of the second electrical circuit at a second node, thereby forming a testing circuit between the first node and the second node.


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