The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Apr. 01, 2022
Applicant:

Rensselaer Polytechnic Institute, Troy, NY (US);

Inventors:

Ge Wang, Loudonville, NY (US);

Guang Li, Nanjing, CN;

Wenxiang Cong, Albany, NY (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/201 (2018.01); G01N 23/20008 (2018.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/201 (2013.01); G01N 23/20008 (2013.01); G01N 2223/054 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/313 (2013.01); G01N 2223/41 (2013.01); G01N 2223/6126 (2013.01);
Abstract

A detection scheme for x-ray small angle scattering is described. An x-ray small angle scattering apparatus may include a first grating and a complementary second grating. The first grating includes a plurality of first grating cells. The complementary second grating includes a plurality of second grating cells. The second grating is positioned relative to the first grating. A configuration of the first grating, a configuration of the second grating and the relative positioning of the gratings are configured to pass one or more small angle scattered photons and to block one or more Compton scattered photons and one or more main x-ray photons.


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