The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Aug. 04, 2020
Applicant:
Kaiser Optical Systems Inc., Ann Arbor, MI (US);
Inventors:
Joseph B. Slater, Dexter, MI (US);
James M. Tedesco, Livonia, MI (US);
Francis Esmonde-White, Ann Arbor, MI (US);
Assignee:
Endress+Hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01); G01N 21/35 (2014.01); G01N 33/00 (2006.01); G01N 21/3504 (2014.01); G01N 21/359 (2014.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01N 21/35 (2013.01); G01N 21/3504 (2013.01); G01N 33/0004 (2013.01); G01N 21/359 (2013.01);
Abstract
The present disclosure includes discloses a method for analyzing a multi-component gas sample using spectroscopy in combination with the measurement of extrinsic or intrinsic properties of the gas sample. The results of the spectroscopic analysis and the measurement are combined to quantify a gas component unseen by the spectroscopic analysis.
Slater, Joseph. (2023). Augmented raman analysis of a gas mixture (U.S. Patent No. 11592398). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11592398
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile