The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Jan. 18, 2018
Hifibio Sas, Paris, FR;
Marcel Reichen, Waedenswill, CH;
Raphael Clément Li-Ming Doineau, Paris, FR;
Sami Ellouze, Chatenay Malabry, FR;
HIFIBIO SAS, Paris, FR;
Abstract
The present invention relates to a method for analyzing and selecting a specific droplet among a plurality of droplets (), comprising the following steps: —providing a plurality of droplets (), —for a droplet () among the plurality of droplets, measuring at least two optical signals, each optical signal being representative of a light intensity spatial distribution in the droplet for an associated wavelength channel, —calculating a plurality of parameters from the optical signals, —determining a sorting class for a droplet according to calculated parameters, —sorting said droplet according to its sorting class, wherein the plurality of parameters comprises the coordinates of a maximum for each optical signal and a co-localization parameter and the at least two calculated parameters used for the determining step comprises the co-localization parameter.