The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Aug. 15, 2019
Applicant:

Faro Technologies, Inc., Lake Mary, FL (US);

Inventors:

Muhammad Umair Tahir, Stuttgart, DE;

Oliver Zweigle, Stuttgart, DE;

Mark Brenner, Asperg, DE;

Michael Müller, Stuttgart, DE;

Simon Raab, Santa Barbara, CA (US);

Steffen Kappes, Oedheim-Degmarn, DE;

Assignee:

FARO TECHNOLOGIES, INC., Lake Mary, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2545 (2013.01);
Abstract

Aspects of the present disclosure provide a system for measuring an object, the system including a plurality of frame segments. The frame segments are configured to mechanically couple together to form a frame. The plurality of frame segments includes a plurality of measurement device link segments and each of the plurality of measurement device link segments includes a measurement device which together form a plurality of measurement devices having a field of view within or adjacent to the frame. Each of the plurality of measurement devices is operable to measure three-dimensional (3D) coordinates for a plurality of points on the object. The system further includes a computing device to receive data from the plurality of measurement devices via a network established by the plurality of measurement device link segments.


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