The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Dec. 05, 2019
Applicant:

Ensco, Inc., Springfield, VA (US);

Inventors:

Anthony Kim, Fairfax, VA (US);

David G. Ford, Fairfax, VA (US);

Jeffrey Bloom, Silver Spring, MD (US);

Assignee:

Ensco, Inc., Springfield, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B61K 9/08 (2006.01); B61L 23/04 (2006.01); E05F 15/70 (2015.01); G01N 21/55 (2014.01); G02B 7/182 (2021.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
B61K 9/08 (2013.01); B61L 23/041 (2013.01); B61L 23/042 (2013.01); E05F 15/70 (2015.01); G01N 21/55 (2013.01); G01N 21/95 (2013.01); G02B 7/182 (2013.01); E05Y 2900/51 (2013.01); G01N 2201/0216 (2013.01); G01N 2201/068 (2013.01);
Abstract

A deployable measurement system for analyzing a rail of a railroad track includes a housing, a reflecting assembly coupled to the housing, a movement assembly coupled to the housing, and an optical measurement system disposed within the housing. Both the housing and the reflecting assembly are moveable between a stored position and a deployed position. The movement assembly includes a deployment assembly that moves the reflecting assembly from the stored position to the deployed position, and a retraction assembly that moves the reflecting assembly from the deployed position to the stored position. The optical measurement system emits and receives light. The reflecting assembly reflects the emitted light toward the rail. The reflecting assembly reflects light reflected off of the rail toward the optical measurement system. The light received by the optical measurement system is used to measure parameters related to the rail.


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