The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Aug. 22, 2018
United States of America As Represented BY the Administrator of Nasa, Washington, DC (US);
Tyler B. Hudson, Suffolk, VA (US);
Fuh-Gwo Yuan, Cary, NC (US);
Nicolas Auwaijan, Lake Forest, CA (US);
Frank L. Palmieri, Hampton, VA (US);
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA, Washington, DC (US);
Abstract
System and method for in-process cure monitoring of a material utilizes one or more sensors such as fiber Bragg gratings (FBGs) or phase-shifted FBGs (PS-FBGs) and at least one optical line fiber connected to the sensor(s). The sensor(s) and the optical line may be embedded in the material prior to curing the material may comprise a fiber reinforced polymer. Waves are excited into the material during curing thereof to form guided waves that propagate through the material. At least one wave metric of the guided waves is measured utilizing the sensor(s).