The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2023

Filed:

Aug. 08, 2017
Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Ryuichi Narita, Tokyo, JP;

Toshiya Watanabe, Tokyo, JP;

Akio Kondou, Tokyo, JP;

Masashi Kitamura, Tokyo, JP;

Hidetaka Haraguchi, Tokyo, JP;

Shuji Tanigawa, Tokyo, JP;

Claus Thomy, Bremen, DE;

Henry Koehler, Bremen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B22F 12/90 (2021.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B22F 10/36 (2021.01); B22F 10/28 (2021.01); G01N 25/18 (2006.01); G01N 25/72 (2006.01);
U.S. Cl.
CPC ...
B22F 12/90 (2021.01); B22F 10/28 (2021.01); B22F 10/36 (2021.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G01N 25/18 (2013.01); G01N 25/72 (2013.01);
Abstract

An internal defect detection system for a three-dimensional additive manufacturing device which performs additive molding by emitting a laser beam to a powder bed is provided. This system specifies a candidate position of an internal defect on the basis of a change amount of a local temperature measured in an irradiated part of a powder bed irradiated by a laser beam. The system calculates a cooling speed at the candidate position on the basis of a temperature distribution and determines whether an internal defect exists on the basis of the cooling speed.


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