The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Aug. 21, 2019
Applicant:
Wisconsin Alumni Research Foundation, Madison, WI (US);
Inventors:
Kevin Shinners, Madison, WI (US);
Cyrus Nigon, Waunakee, WI (US);
Assignee:
WISCONSIN ALUMNI RESEARCH FOUNDATION, Madison, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01D 41/127 (2006.01); A01D 41/06 (2006.01); A01F 29/04 (2006.01); A01D 45/02 (2006.01); A01D 45/30 (2006.01);
U.S. Cl.
CPC ...
A01D 41/1271 (2013.01); A01D 41/06 (2013.01); A01F 29/04 (2013.01); A01D 45/021 (2013.01); A01D 45/30 (2013.01);
Abstract
A residue management system or method can be implemented for an agricultural harvester that includes a residue processing system. A sensor arrangement can be in communication with one or more components of the residue processing system. The sensor arrangement can be configured to measure indicators of a mass flow rate of the crop residue through the crop residue system across a width of a stream of the crop residue.
Shinners, Kevin. (2023). Residue monitoring (U.S. Patent No. 11589510). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11589510
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile