The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Jul. 01, 2021
Applicant:

Mediatek Inc., Hsinchu, TW;

Inventors:

Tun-Ping Huang, Hsinchu, TW;

Wei-De Wu, Hsinchu, TW;

Mao-Ching Chiu, Hsinchu, TW;

Chia-Wei Tai, Hsinchu, TW;

Tien-Yu Lin, Hsinchu, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/18 (2006.01); H04L 1/00 (2006.01); H03M 13/27 (2006.01); H03M 13/13 (2006.01); H03M 13/09 (2006.01); H03M 13/00 (2006.01); H04L 1/08 (2006.01); H03M 13/29 (2006.01); H04L 1/1812 (2023.01); H04L 1/1867 (2023.01);
U.S. Cl.
CPC ...
H04L 1/1819 (2013.01); H03M 13/09 (2013.01); H03M 13/13 (2013.01); H03M 13/27 (2013.01); H03M 13/2906 (2013.01); H03M 13/618 (2013.01); H03M 13/6306 (2013.01); H03M 13/6362 (2013.01); H04L 1/0042 (2013.01); H04L 1/0057 (2013.01); H04L 1/0061 (2013.01); H04L 1/0068 (2013.01); H04L 1/0071 (2013.01); H04L 1/08 (2013.01); H04L 1/1893 (2013.01);
Abstract

Examples pertaining to additional bit freezing for polar coding are described. An apparatus performs polar coding to encode a plurality of input subblocks of information bits, frozen bits and optional cyclic redundancy check (CRC) bits to generate a plurality of subblocks of coded bits. The apparatus then transmits at least some of the subblocks of coded bits. In performing the polar coding, the apparatus additionally freezes one of the plurality of input subblocks corresponding to one of the interleaved plurality of subblocks of coded bits which decreases polarization gain due to puncturing.


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