The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Jun. 01, 2021
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Stephen Conrad, Bedford, MA (US);

Adam Alexander Libson, Newton, MA (US);

Andrew Benedick, Stow, MA (US);

Dale H. Martz, Somerville, MA (US);

Jonathan Twichell, Acton, MA (US);

Eli Doris, Somerville, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/50 (2013.01); H04B 10/67 (2013.01); H04B 10/548 (2013.01);
U.S. Cl.
CPC ...
H04B 10/50577 (2013.01); H04B 10/548 (2013.01); H04B 10/675 (2013.01);
Abstract

A High Bandwidth Individual Channel Control via Optical Reference Interferometry (HICCORI) system actively controls the phase and/or polarization of the optical emission of each element in a tiled optical array. It can also actively align any high-frequency broadening waveform applied to the array beams for spectral broadening or data transmission. By maintaining consistent polarization and manipulating the phase relationships of the beams emitted by the array elements, the HICCORI system can manipulate the spatial pattern of constructive and destructive interference formed as the individual emissions coherently combine. Active feedback control allows the desired phase, polarization, and/or spectral broadening alignment to be maintained in the presence of external disturbances.


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