The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Oct. 16, 2019
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Go Itami, Tokyo, JP;

Yohei Toriumi, Tokyo, JP;

Jun Kato, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q 15/00 (2006.01); H01Q 15/14 (2006.01);
U.S. Cl.
CPC ...
H01Q 15/0046 (2013.01); H01Q 15/002 (2013.01); H01Q 15/141 (2013.01);
Abstract

To accurately estimate frequency characteristics from structural parameters of a frequency selective surface. A frequency selective surface design apparatus includes an LC generation unitthat receives an input of a structural parameter, and generates an inductance L and a capacitance C of a unit cell, a corrected resonance point calculation unitthat receives the number n of times of calculation input from an outside, the inductance L, and the capacitance C, models a correction circuit by using a circuit in which a virtual capacitance is connected in parallel via a transmission line to each distribution inductance obtained by division of the inductance L by the calculation number n and the transmission line is terminated at the capacitance C, and calculates a corrected resonant frequency fC from the impedance of the correction circuit, and a characteristic calculation unitthat receives inputs of the inductance L, the capacitance C, and the corrected resonant frequency fC, calculates a pre-correction resonant frequency from the inductance L and the capacitance C, obtains a correction coefficient by dividing the corrected resonant frequency fC by the pre-correction resonant frequency, and calculates a corrected return loss and a corrected insertion loss.


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