The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2023
Filed:
Nov. 21, 2019
Applicant:
Hyundai Autron Co., Ltd., Seoul, KR;
Inventors:
Yeon-Ho Kim, Seoul, KR;
Keon Lee, Gwangju-si, KR;
Ji-Hoon Lim, Gwangju-si, KR;
Min-Ji Park, Seoul, KR;
Jae-Hyuck Woo, Osan-si, KR;
Yun-Ho Choi, Seoul, KR;
Assignee:
HYUNDAI MOBIS CO., LTD., Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3187 (2006.01); G11C 29/12 (2006.01); G01R 31/319 (2006.01); G01R 31/3167 (2006.01);
U.S. Cl.
CPC ...
G11C 29/1201 (2013.01); G01R 31/3167 (2013.01); G01R 31/3187 (2013.01); G01R 31/31924 (2013.01);
Abstract
An integrated circuit test apparatus includes: a first test unit configured to output a current for a built-in self test (BIST) progress state for each internal circuit of an integrated circuit in a BIST test mode and to determine whether each internal circuit operates normally in a wake-up mode of the integrated circuit; and a first determination module configured to determine whether each internal circuit is in a stuck state based on a change detected by the first test unit.