The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Nov. 11, 2020
Applicant:

Novatek Microelectronics Corp., Hsinchu, TW;

Inventors:

Qiqiang Han, Shaanxi, CN;

JianHua Liang, ShaanXi, CN;

YuanJia Du, Shandong, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 3/3208 (2016.01); H01L 27/32 (2006.01); G09G 5/10 (2006.01);
U.S. Cl.
CPC ...
G09G 3/3208 (2013.01); G09G 5/10 (2013.01); H01L 27/32 (2013.01); G09G 2320/041 (2013.01); G09G 2320/0666 (2013.01);
Abstract

A method of and a display control device for emulating OLED degradation for an OLED display panel are proposed, where the OLED display panel includes pixels, and each of the pixels includes subpixels. The method includes the following steps. A current image signal is received. A driving signal level for each of the subpixels is determined based on the current image signal. An actual surface temperature of each of the subpixels is estimated based on the corresponding driving signal level. An accumulated stress of each of the subpixels is computed based on the corresponding driving signal level, the corresponding actual surface temperature, and at least one previous image signal prior to the current image signal. A degradation map that emulates OLED degradation of the OLED display panel is generated based on the accumulated stress of each of the subpixels.


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