The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

May. 14, 2020
Applicant:

Raytheon Company, Waltham, MA (US);

Inventor:

Steven A. Israel, Fairfax, VA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/52 (2022.01); G06N 3/08 (2006.01); G06T 7/80 (2017.01); G06V 20/13 (2022.01);
U.S. Cl.
CPC ...
G06V 20/52 (2022.01); G06N 3/08 (2013.01); G06T 7/80 (2017.01); G06V 20/13 (2022.01); G06T 2207/10032 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A machine accesses a set of image target models, each image target model being associated with model parameters, the model parameters comprising at least an operational domain, an expected input image quality, and an expected orientation. The machine receives an image for processing by one or more image target models from the set, the image including metadata specifying image parameters of the received image. The machine identifies, based on the image parameters in the metadata of the received image and the model parameters of one or more models in the set, a first subset of the set of image target models including image target models that are capable of processing the received image. The machine provides the received image to at least one image target model in the first subset.


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