The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2023
Filed:
Oct. 12, 2018
Applicant:
Tusimple, Inc., San Diego, CA (US);
Inventors:
Assignee:
TUSIMPLE, INC., San Diego, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/44 (2022.01); G05D 1/02 (2020.01); G06T 7/12 (2017.01); G06K 9/62 (2022.01); G06V 10/26 (2022.01); G06V 20/58 (2022.01);
U.S. Cl.
CPC ...
G06V 10/44 (2022.01); G05D 1/0246 (2013.01); G06K 9/6251 (2013.01); G06T 7/12 (2017.01); G06V 10/26 (2022.01); G06V 20/58 (2022.01); G05D 2201/0213 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30252 (2013.01); G06T 2207/30261 (2013.01);
Abstract
A system and method for occluding contour detection using a fully convolutional neural network is disclosed. A particular embodiment includes: receiving an input image; producing a feature map from the input image by semantic segmentation; learning an array of upscaling filters to upscale the feature map into a final dense feature map of a desired size; applying the array of upscaling filters to the feature map to produce contour information of objects and object instances detected in the input image; and applying the contour information onto the input image.