The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Oct. 15, 2020
Applicant:

Hitachi Solutions, Ltd., Tokyo, JP;

Inventors:

Ziwei Deng, Tokyo, JP;

Quan Kong, Tokyo, JP;

Naoto Akira, Tokyo, JP;

Tomokazu Murakami, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/00 (2022.01); G06V 10/26 (2022.01); G06T 7/11 (2017.01); G06K 9/62 (2022.01); G06T 7/194 (2017.01); G06T 7/13 (2017.01); G06V 10/40 (2022.01); G06V 30/262 (2022.01);
U.S. Cl.
CPC ...
G06V 10/26 (2022.01); G06K 9/6232 (2013.01); G06K 9/6256 (2013.01); G06K 9/6267 (2013.01); G06T 7/11 (2017.01); G06T 7/13 (2017.01); G06T 7/194 (2017.01); G06V 10/40 (2022.01); G06V 30/274 (2022.01); G06T 2207/10116 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Provided are: an amodal segmentation unit that generates a set of first amodal masks indicating a probability that a particular pixel belongs to a relevant object for each of objects, with respect to an input image in which a plurality of the objects partially overlap; an overlap segmentation unit that generates an overlap mask corresponding only to an overlap region where the plurality of objects overlap in the input image based on an aggregate mask obtained by combining the set of first amodal masks generated for each of the objects and a feature map generated based on the input image; and an amodal mask correction unit that generates and outputs a second amodal mask, which includes an annotation label indicating a category of each of the objects corresponding to a relevant pixel, for each of pixels in the input image using the overlap mask and the aggregate mask.


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