The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Mar. 01, 2021
Applicant:

Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;

Inventor:

Yongquan Ye, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); G06V 10/751 (2022.01);
Abstract

Systems and methods for determining a distribution map of susceptibility property of an object are provided. The method may include one or more of the following operations. A phase diagram corresponding to a magnetic resonance (MR) signal of the object may be obtained. A preliminary field map may be determined based on the phase diagram. Preliminary error limiting information associated with the preliminary field map may be obtained. A preliminary distribution map of susceptibility property of the object may be determined based on the preliminary field map and the preliminary error limiting information. An iteration process including at least one iteration may be performed to determine a target distribution map of susceptibility property of the object.


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