The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Sep. 06, 2018
Applicant:

Goertek Inc., Shandong, CN;

Inventors:

Xinxin Han, Weifang, CN;

Zhiyong Zhao, Weifang, CN;

Nanjing Dong, Weifang, CN;

Debo Sun, Weifang, CN;

Assignee:

GOERTEK INC., Weifang, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/136 (2017.01); G06T 7/62 (2017.01); G06T 7/11 (2017.01); G06T 7/66 (2017.01); G06T 7/13 (2017.01); G01N 21/88 (2006.01); G09G 5/10 (2006.01); H04N 9/31 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01N 21/8851 (2013.01); G06T 7/11 (2017.01); G06T 7/13 (2017.01); G06T 7/136 (2017.01); G06T 7/62 (2017.01); G06T 7/66 (2017.01); G06T 2207/30168 (2013.01); G09G 5/10 (2013.01); G09G 2330/10 (2013.01); H04N 9/3194 (2013.01);
Abstract

Provided are a method and an apparatus for detecting pixel defect of optical module, and a device, where the method includes: graying an image obtained by imaging a test binary image by an optical module in a darkroom environment to obtain a first grayscale image; determining a first grayscale area and a second grayscale area corresponding to two gray levels in the test binary image from the first grayscale image; determining a pixel point not matching a grayscale feature of respective grayscale region from the first grayscale area and the second grayscale area respectively as a pixel defect point; and determining the pixel defect of the optical module according to the pixel defect point. The technical solution provided in the present disclosure can detect accurately a pixel defect of an optical module which is advantageous in optimizing the processing technology of the optical module.


Find Patent Forward Citations

Han, Xinxin. (2023). Method and apparatus for detecting pixel defect of optical module, and device (U.S. Patent No. 11587219). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11587219

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…