The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2023
Filed:
Dec. 11, 2017
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Ichirou Akimoto, Tokyo, JP;
Yousuke Motohashi, Tokyo, JP;
Naoki Sawada, Tokyo, JP;
Daisuke Yokoi, Tokyo, JP;
Masayuki Ikeda, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06N 20/00 (2019.01); G06F 11/07 (2006.01); G06K 9/62 (2022.01); G06N 5/00 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 11/079 (2013.01); G06K 9/6234 (2013.01); G06K 9/6256 (2013.01); G06N 5/003 (2013.01);
Abstract
A failure analysis deviceis provided with an identification unitthat discriminates whether a predetermined failure has occurred on the basis of a learning model for discriminating the presence or absence of an occurrence of the predetermined failure learned by using a cause attribute which is associated with a cause of the predetermined failure and on the basis of a value of the attribute, and that identifies the cause of the predetermined failure discriminated to have occurred and countermeasures therefor.