The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Jan. 30, 2020
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Parminder Singh Sethi, Punjab, IN;

Akanksha Goel, Faridabad, IN;

Hung T. Dinh, Austin, TX (US);

Sabu K. Syed, Austin, TX (US);

James S. Watt, Austin, TX (US);

Kannappan Ramu, Frisco, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06N 3/08 (2023.01); G06F 3/06 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06F 3/067 (2013.01); G06F 3/0614 (2013.01); G06F 3/0629 (2013.01); G06F 11/3072 (2013.01); G06N 3/08 (2013.01);
Abstract

Methods, apparatus, and processor-readable storage media for device component management using deep learning techniques are provided herein. An example computer-implemented method includes obtaining telemetry data from one or more enterprise devices; determining, for each of the one or more enterprise devices, values for multiple device attributes by processing the obtained telemetry data; generating, for each of the one or more enterprise devices, at least one prediction related to lifecycle information of at least one device component by processing the determined attribute values using one or more deep learning techniques; and performing one or more automated actions based at least in part on the at least one generated prediction.


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