The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Dec. 17, 2018
Applicant:

Integrated Silicon Solution, (Cayman) Inc., Grand Cayman, KY;

Inventors:

Michail Tzoufras, Sunnyvale, CA (US);

Marcin Gajek, Berkeley, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06N 3/10 (2006.01); G11C 11/16 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/04 (2013.01); G06N 3/10 (2013.01); G11C 11/1673 (2013.01); G11C 11/1675 (2013.01);
Abstract

A computing device receives first data on which to train an artificial neural network (ANN). Using magnetic random access memory (MRAM), the computing device trains the ANN by performing a first set of training iterations on the first data. Each of the first set of iterations includes writing values for a set of weights of the ANN to the MRAM using first write parameters corresponding to a first write error rate. After performing the first set of iterations, the computing device performs a second set of training iterations on the first data. Each of the second set of iterations includes writing values for the set of weights of the ANN to the MRAM using second write parameters corresponding to a second write error rate. The second write error rate is lower than the first write error rate. The computing device stores values for the trained ANN.


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