The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Nov. 21, 2018
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Jason R. Thornton, Chelmsford, MA (US);

Luke Skelly, Groton, MA (US);

Michael Chan, Bedford, MA (US);

Ronald Duarte, Warwick, RI (US);

Daniel Scarafoni, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06N 3/08 (2006.01); G06N 3/084 (2023.01);
U.S. Cl.
CPC ...
G06N 3/04 (2013.01); G06N 3/084 (2013.01);
Abstract

Systems and methods are provided for selecting an optimized data model architecture subject to resource constraints. One or more resource constraints for target deployment are identified, and random model architectures are generated from a set of model architecture production rules subject to the one or more resource constraints. Each random model architecture is defined by randomly chosen values for one or more meta parameters and one or more layer parameters. One or more of the random model architectures are adaptively refined to improve performance relative to a metric, and the refined model architecture with the best performance relative to the metric is selected.


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