The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Oct. 24, 2018
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Fariborz Assaderaghi, Emerald Hills, CA (US);

Marc Joye, Palo Alto, CA (US);

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06K 9/62 (2022.01); G06N 3/08 (2023.01); G06N 5/04 (2023.01);
U.S. Cl.
CPC ...
G06K 9/6269 (2013.01); G06N 3/08 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

A method and data processing system for detecting tampering of a machine learning model is provided. The method includes training a machine learning model. During a training operating period, a plurality of input values is provided to the machine learning model. In response to a predetermined invalid input value, the machine learning model is trained that a predetermined output value will be expected. The model is verified that it has not been tampered with by inputting the predetermined invalid input value during an inference operating period. If the expected output value is provided by the machine learning model in response to the predetermined input value, then the machine learning model has not been tampered with. If the expected output value is not provided, then the machine learning model has been tampered with. The method may be implemented using the data processing system.


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