The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2023
Filed:
May. 27, 2021
Splunk Inc., San Francisco, CA (US);
Zhuxuan Jin, Sunnyvale, CA (US);
George Apostolopoulos, San Jose, CA (US);
Splunk Inc., San Francisco, CA (US);
Abstract
A method is disclosed that includes receiving, at a computing device, an event log including multiple events, where the events are derived from machine data, determining a first score associated with a first granularity level by comparing an event from the event log with a first frequent patterns generated for the first granularity level, and determining a second score associated with a second granularity level by comparing the event with a second frequent patterns generated for the second granularity level. The method further includes determining an aggregate score for the event based on the first score and the second score, and comparing the aggregate score for the event with an anomaly score threshold. Further, the method includes issuing an alert identifying the event as an anomaly based on the aggregate score exceeding the anomaly score threshold.