The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Nov. 11, 2021
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Ravikanth Tadepally, Hyderabad, IN;

Suki Ramasamy, Chennai, IN;

Mohan Sundaresan, Secunderabad, IN;

Sreenivas Chintada, Chennai, IN;

Assignee:

Bank of America Corporation, Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/215 (2019.01); G06F 16/25 (2019.01); G06F 16/2458 (2019.01); G06F 16/22 (2019.01); G06F 16/35 (2019.01); G06F 16/903 (2019.01); G06F 30/27 (2020.01); G06F 16/2455 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/2255 (2019.01); G06F 16/2462 (2019.01); G06F 16/254 (2019.01); G06F 16/258 (2019.01); G06F 16/35 (2019.01); G06F 16/24564 (2019.01); G06F 16/90344 (2019.01); G06F 30/27 (2020.01);
Abstract

Systems, methods and apparatus are provided for AI-based generation of data warehouse quality protocols. An attribute classifier may quantify relationships between source data and target data from an enterprise data warehouse. A data quality engine may apply these relationships to identify specific data quality concerns and generate customized data quality metrics. A user interface may enable a user to enter parameters for the classification protocols and corresponding rule-based generation of data quality metrics.


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