The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Jul. 02, 2021
Applicant:

Grammatech, Inc., Ithaca, NY (US);

Inventors:

David Gordon Melski, Ithaca, NY (US);

Eric Rizzi, Ithaca, NY (US);

Vlad Folts, Ithaca, NY (US);

Assignee:

GRAMMATECH, INC., Ithaca, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3688 (2013.01); G06F 21/57 (2013.01);
Abstract

Certain example embodiments relate to software test with automated configurable harness capabilities. Certain example embodiments automatically generate harnesses and properly encoded seed inputs by recording the input operations of a system under test (SUT), identifying the processes to be fuzz tested, generating seed inputs and a manifest describing the SUT's input vectors, and generating the harness to effectively feed derived (and potentially 'malformed') input to the SUT. The techniques described herein may be used to test a computer system, e.g., to probe for potential vulnerabilities.


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